![ZEISS PiWeb leistungsstarke Statistiken ZEISS PiWeb leistungsstarke Statistiken]({"xsmall":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb-powerful-statistics.jpg/_jcr_content/renditions/original.image_file.100.33.file/piweb-powerful-statistics.jpg","small":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb-powerful-statistics.jpg/_jcr_content/renditions/original.image_file.360.120.file/piweb-powerful-statistics.jpg","medium":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb-powerful-statistics.jpg/_jcr_content/renditions/original.image_file.768.256.file/piweb-powerful-statistics.jpg","large":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb-powerful-statistics.jpg/_jcr_content/renditions/original.image_file.1024.341.file/piweb-powerful-statistics.jpg","xlarge":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb-powerful-statistics.jpg/_jcr_content/renditions/original.image_file.1280.427.file/piweb-powerful-statistics.jpg","xxlarge":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb-powerful-statistics.jpg/_jcr_content/renditions/original.image_file.1440.480.file/piweb-powerful-statistics.jpg","max":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb-powerful-statistics.jpg/_jcr_content/renditions/original./piweb-powerful-statistics.jpg"})
Aufschlussreiche Statistiken mit ZEISS PiWeb
Umfassende Statistiken ganz einfach erstellen
Ob Sie Informationen über die Qualität Ihrer Messergebnisse oder Ihren Produktionsprozess benötigen: ZEISS PiWeb unterstützt Sie mit sämtlichen Statistiken, die Ihnen helfen, Ihre Produktionsqualität zu verfolgen.
![Gage-R&R-Studien Gage-R&R-Studien]({"xsmall":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_powerful-statistics.jpg/_jcr_content/renditions/original.image_file.100.56.file/piweb_powerful-statistics.jpg","small":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_powerful-statistics.jpg/_jcr_content/renditions/original.image_file.360.203.file/piweb_powerful-statistics.jpg","medium":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_powerful-statistics.jpg/_jcr_content/renditions/original.image_file.768.432.file/piweb_powerful-statistics.jpg","large":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_powerful-statistics.jpg/_jcr_content/renditions/original.image_file.1024.576.file/piweb_powerful-statistics.jpg","xlarge":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_powerful-statistics.jpg/_jcr_content/renditions/original.image_file.1280.720.file/piweb_powerful-statistics.jpg","xxlarge":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_powerful-statistics.jpg/_jcr_content/renditions/original.image_file.1440.810.file/piweb_powerful-statistics.jpg","max":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_powerful-statistics.jpg/_jcr_content/renditions/original./piweb_powerful-statistics.jpg"})
![Gage-R&R-Studien Gage-R&R-Studien]({"xsmall":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_powerful-statistics.jpg/_jcr_content/renditions/original.image_file.100.56.file/piweb_powerful-statistics.jpg","small":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_powerful-statistics.jpg/_jcr_content/renditions/original.image_file.360.203.file/piweb_powerful-statistics.jpg","medium":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_powerful-statistics.jpg/_jcr_content/renditions/original.image_file.768.432.file/piweb_powerful-statistics.jpg","large":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_powerful-statistics.jpg/_jcr_content/renditions/original.image_file.1024.576.file/piweb_powerful-statistics.jpg","xlarge":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_powerful-statistics.jpg/_jcr_content/renditions/original.image_file.1280.720.file/piweb_powerful-statistics.jpg","xxlarge":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_powerful-statistics.jpg/_jcr_content/renditions/original.image_file.1440.810.file/piweb_powerful-statistics.jpg","max":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_powerful-statistics.jpg/_jcr_content/renditions/original./piweb_powerful-statistics.jpg"})
Gage-R&R-Studien
Führen Sie Gage-R&&R-Studien vom Typ I, II und III,, ARM- und ANOVA-Auswertungen mit taktilen, optischen oder manuellen Messdaten durch.
![Regelkarten Regelkarten]({"xsmall":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_control-chart.jpg/_jcr_content/renditions/original.image_file.100.56.file/piweb_control-chart.jpg","small":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_control-chart.jpg/_jcr_content/renditions/original.image_file.360.203.file/piweb_control-chart.jpg","medium":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_control-chart.jpg/_jcr_content/renditions/original.image_file.768.432.file/piweb_control-chart.jpg","large":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_control-chart.jpg/_jcr_content/renditions/original.image_file.1024.576.file/piweb_control-chart.jpg","xlarge":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_control-chart.jpg/_jcr_content/renditions/original.image_file.1280.720.file/piweb_control-chart.jpg","xxlarge":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_control-chart.jpg/_jcr_content/renditions/original.image_file.1440.810.file/piweb_control-chart.jpg","max":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_control-chart.jpg/_jcr_content/renditions/original./piweb_control-chart.jpg"})
![Regelkarten Regelkarten]({"xsmall":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_control-chart.jpg/_jcr_content/renditions/original.image_file.100.56.file/piweb_control-chart.jpg","small":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_control-chart.jpg/_jcr_content/renditions/original.image_file.360.203.file/piweb_control-chart.jpg","medium":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_control-chart.jpg/_jcr_content/renditions/original.image_file.768.432.file/piweb_control-chart.jpg","large":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_control-chart.jpg/_jcr_content/renditions/original.image_file.1024.576.file/piweb_control-chart.jpg","xlarge":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_control-chart.jpg/_jcr_content/renditions/original.image_file.1280.720.file/piweb_control-chart.jpg","xxlarge":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_control-chart.jpg/_jcr_content/renditions/original.image_file.1440.810.file/piweb_control-chart.jpg","max":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_control-chart.jpg/_jcr_content/renditions/original./piweb_control-chart.jpg"})
Regelkarten
Werten Sie Prozessdaten mit integrierten Plots für x̅, S (Standardabweichung) und R (Bereich) aus.
![Fähigkeitsnachweise Fähigkeitsnachweise]({"xsmall":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original.image_file.100.56.27,21,1863,1055.file/piweb_capability-studies.jpg","small":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original.image_file.360.203.27,21,1863,1055.file/piweb_capability-studies.jpg","medium":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original.image_file.768.432.27,21,1863,1055.file/piweb_capability-studies.jpg","large":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original.image_file.1024.576.27,21,1863,1055.file/piweb_capability-studies.jpg","xlarge":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original.image_file.1280.720.27,21,1863,1055.file/piweb_capability-studies.jpg","xxlarge":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original.image_file.1440.810.27,21,1863,1055.file/piweb_capability-studies.jpg","max":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original.image_file.1836.1033.27,21,1863,1055.file/piweb_capability-studies.jpg"})
![Fähigkeitsnachweise Fähigkeitsnachweise]({"xsmall":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original.image_file.100.56.file/piweb_capability-studies.jpg","small":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original.image_file.360.203.file/piweb_capability-studies.jpg","medium":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original.image_file.768.432.file/piweb_capability-studies.jpg","large":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original.image_file.1024.576.file/piweb_capability-studies.jpg","xlarge":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original.image_file.1280.720.file/piweb_capability-studies.jpg","xxlarge":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original.image_file.1440.810.file/piweb_capability-studies.jpg","max":"https://www.zeiss.de/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original./piweb_capability-studies.jpg"})
Fähigkeitsnachweise
Erbringen Sie die verschiedensten Fähigkeitsnachweise (einschließlich Cm, Cmk, Cp, Cpk, Po, Pok usw.).
Weitere Tools
Erstellen Sie Berichte, die andere nützliche Instrumente wie Box-Plots, Histogramme, Trendlinien und Balkendiagramme enthalten.